Work

Trap-loss fluorescence spectroscopy of Cs MOT with 319-nm single-step Rydberg excitation and application to measurement of the background electric field

Year: 2025
Type: conference-abstract
Authors: Junmin Wang, Xiao-Kai Hou, Yue-Wei Wang, Wen-Jing Su, Yi-Rong Wei, Jun He
Language: English
Open Access status: closed
OpenAlex ID: W4409158045
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