Trap-loss fluorescence spectroscopy of Cs MOT with 319-nm single-step Rydberg excitation and application to measurement of the background electric field
Year: 2025
Type: conference-abstract
DOI: 10.1117/12.3056090
Authors: Junmin Wang, Xiao-Kai Hou, Yue-Wei Wang, Wen-Jing Su, Yi-Rong Wei, Jun He
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409158045
