Interleaving metasurface spectrometers to extend the high-quality measurement range
Year: 2025
Type: article
Abstract: Metasurfaces allow the manipulation of light without the size and weight of traditional optical elements, and offer a path to the type of ultra-compact optical systems needed if optical sensors are to be integrated within manufacturing chains without disrupting them. Here we look at the use of a spatially interleaved metasurface as a method to extend the spectral range over which high-resolution measurements can be obtained with an off-axis metasurface lens. Such a spectrometer exploits chromatic abberation to separate out different wavelengths of light, however the abberation will lead to a degredation in the resolution. By spatially interleaving two such devices the measurement range over which the abberation is minimised can be extended, leading to a more useful device.
Authors: J Kendrick, A J Henning, H Martin, J Williamson, D Tang, N Sharma, X Jiang
Institution: University of Huddersfield
Language: English
Field: Materials Science
Domain: Physical Sciences
Open Access status: hybrid
Estimated APC paid: $3,325
OpenAlex ID: W4409158726