Work

First write pulse-induced interface damage in ferroelectric field-effect transistors

Year: 2024

Type: conference-paper

Source: IEEE International Integrated Reliability Workshop final report

DOI: 10.1109/iirw62856.2024.10947144

Authors: Priyankka Gundlapudi Ravikumar, Chinsung Park, Prasanna Venkatesan Ravindran, Nashrah Afroze, Mengkun Tian, Winston Chern, Suman Datta, Shimeng Yu, Souvik Mahapatra, Asif Khan

Institutions: Georgia Institute of Technology, Indian Institute of Technology Bombay

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409185432

FWCI: 3.114

Cites: 9

Cited by: 4

Related to: 10