Year: 2025
Type: conference-paper
Abstract: We report the first experimental results on the design and fabrication of nanoscale on-wafer calibration standards operating up to 110 GHz. The propagation constant and effective permittivity of coplanar waveguide (CPW) transmission lines (TLs) are extracted from raw S-parameters using the Thru-Reflect-Line (TRL) method. Experimental data show deviations in extracted propagation characteristics when comparing nanostructures to microscale structures.
Source: EPJ Web of Conferences
Authors: Daouda Seck, Djamel Allal, Florent Marlec, Clément Lenoir, Mohamed Sebbache, Kamel Haddadi
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W4409208877