Work

Joint Uplink and Downlink Probe Selection for Bi-directional Channel Emulation in OTA Testing

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Communication Technology (ICCT)

DOI: 10.1109/icct62411.2024.10946417

Authors: Qingzhou Huan, Haomin Wang, Yuhang Guo, Xiaodong Ji, Yong Li

Institutions: Beijing University of Posts and Telecommunications, China Academy of Information and Communications Technology

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

OpenAlex ID: W4409248167

FWCI:

Cites: 12

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Related to: 10