Experimental Investigation on Fatigue Failure Evolution of Press-Pack IGBT Devices Under MMC Operating Conditions
Year: 2025
Type: article
Authors: Wei Lai, Yunjie Wu, Anbin Liu, Zhiyong Yuan, Kai Ma, Hui Li, Yan Xiong, Ying Li, Ran Yao
Institutions: Chongqing University, China Southern Power Grid (China)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G5580050230
OpenAlex ID: W4409249401