Work

Fatigue damage mechanisms and critical current degradation in REBCO tapes at cryogenic temperature

Year: 2025

Type: article

Source: Superconductor Science and Technology

DOI: 10.1088/1361-6668/adca5c

Authors: Pengnian Zhang, Jiaming Zhang, Xingzhe Wang, Mingzhi Guan

Institutions: Lanzhou University, Chinese Academy of Sciences, Institute of Modern Physics

Language: English

Topic: Superconducting Materials and Applications

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Lanzhou University, National Natural Science Foundation of China

Awards: G8555834433, G918502700

OpenAlex ID: W4409252499

FWCI: 0.705

Cites: 45

Cited by: 3

Related to: 10