Quantitative characterization of speckle-based x-ray imaging setup for sub-resolution microstructure analysis using standardized samples
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3046978
Authors: Austin W. Zhuang, Ryan A. Fair, Peter B. Noël
Institution: University of Pennsylvania
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409253149
