Work

Quantitative characterization of speckle-based x-ray imaging setup for sub-resolution microstructure analysis using standardized samples

Year: 2025
Type: conference-paper
Authors: Austin W. Zhuang, Ryan A. Fair, Peter B. Noël
Language: English
Subfield: Radiation
Open Access status: closed
OpenAlex ID: W4409253149
FWCI:
Cites: 7
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Related to: 10