Deep learning fluoroscopy denoising: a beam quality insensitive approach
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3040524
Authors: Joseph F. Whitehead, Yi Hu, Jong Woo Kim, Yu-Bing Chang, John Baumgart, Joseph Manak
Institution: Canon (United States)
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409253590
