Work

Log conversion with fewer counts for photon counting CT: decreasing both bias and variance simultaneously

Year: 2025

Type: conference-paper

Source: SPIE Medical Imaging: Physics of Medical Imaging

DOI: 10.1117/12.3046256

Authors: Jia Wei, Donghyeon Lee, Karl Stierstorfer, George S. K. Fung, Christoph Polster, Shalini Subramanian, Katsuyuki Taguchi

Institutions: Johns Hopkins University, Siemens Healthineers (Germany), Siemens Healthcare (United States)

Language: English

Topic: Advanced X-ray and CT Imaging

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409253600

FWCI: 5.805

Cites: 10

Cited by: 2

Related to: 10