Work

Four-Port Probe Calibration Using 64-Term Error Model for On-Wafer S-Parameter Measurement of Microwave Circuits Up to 110 GHz

Year: 2025

Type: article

Source: IEEE Transactions on Circuits and Systems I Regular Papers

DOI: 10.1109/tcsi.2025.3544672

Authors: Jiefeng Zhou, Ling Zhang, Ziyang Chen, Da Li, Jun Fan, Er-Ping Li

Institution: Zhejiang University

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Awards: G1138920530, G4972286815, G6361819182, G724502663, 人工智能激发式类脑芯片电磁完整性关键技术基础研究

OpenAlex ID: W4409257367

FWCI: 0.693

Cites: 44

Cited by: 3

Related to: 10