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CRAFT: Class Ranking Aware Fine-Tuning for Enhanced Out-of-Distribution Detection

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Year: 2025
Type: conference-paper
Source: IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)
DOI: 10.1109/wacv61041.2025.00405
Authors: Naveen Karunanayake, Suranga Seneviratne, Sanjay Chawla
Institutions: The University of Sydney, Hamad bin Khalifa University
Language: English

Topic: Adversarial Robustness in Machine Learning
Subfield: Artificial Intelligence
Field: Computer Science
Domain: Physical Sciences

Open Access status: closed

Funder: Australian Research Council
Award: Betrayed by Apps: Automated, Scalable Detection of Mobile App Malpractices
OpenAlex ID: W4409262364
FWCI:
Cites: 43
Cited by:
Related to: 10
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