Year: 2024
Type: conference-paper
Abstract: The infiltration of counterfeit electronics into the global supply chain is a growing concern that poses significant challenges for both manufacturers and consumers. This paper introduces Flash-Odometer, an innovative technique designed to estimate the age and usage statistics of NAND flash memory blocks. Flash-Odometer works by analyzing key characteristics of NAND arrays, which are highly dependent on the defect density in the gate dielectric of the flash memory cells. Our experimental evaluation, conducted on state-of-the-art 3D NAND chips from a leading manufacturer, demonstrates that the Flash-Odometer accurately predicts the program-erase (PE) cycle count of NAND memory blocks. This provides a unique and reliable method for estimating chip usage, which is instrumental in detecting recycled memory chips.
Authors: Matchima Buddhanoy, Biswajit Ray
Institution: Colorado State University
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: gold
Funder: National Science Foundation
Awards: CNS Core: Small: Ensuring Privacy by Runtime Analog Sanitization of Solid State Storage Devices, CAREER: Leveraging physical properties of modern flash memory chips for resilient, secure, and energy-efficient edge storage systems, EAGER: SaTC: Applying Adversarial Machine Learning Techniques to Recover Deleted Information from Flash Storage
OpenAlex ID: W4409282804