Year: 2024
Type: conference-paper
Abstract: In FinFET nodes, high transistor power densities in a power amplifier (PA) lead to device self-heating (SH), degrading performance. This study investigates the impact of SH in large PA FinFET arrays. An encoder-decoder network, together with a long short-term memory model, is used for rapid and accurate thermal analysis. This fast analyzer helps better explore design optimizations than conventional computationally-expensive thermal solvers. The work explores methods for mitigating thermal effects in PAs by inserting dummy transistors within the array of active FinFET devices, and shows the impact of duty cycle and frequency on PA performance.
Authors: Nibedita Karmokar, Sai-Wang Tam, Thanh Viet Dinh, Vidya A. Chhabria, Ramesh Harjani, Sachin S. Sapatnekar
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Award: G3249381572
OpenAlex ID: W4409285496