Work

Contrast analysis for rapid characterization of 2D WTe2 structures

Year: 2025

Type: article

Abstract: Two-dimensional (2D) layered materials, particularly transition metal dichalcogenides, exhibit unique electronic and optical properties. Among these, tungsten ditelluride (WTe2) has garnered attention for its semi-metallic behavior and topologically nontrivial band structure, making it a promising candidate for advanced nanoelectronic applications. A significant challenge, however, lies in achieving scalable characterization, determining thickness and coverage of WTe2 structures. Existing methods are often limited by time constraints and lack suitability for high-throughput workflows. This study introduces a refined workflow combining optical imaging, segmentation, and contrast analysis to address these limitations. Calculated values of normalized optical contrast were correlated with thicknesses determined by atomic force microscopy and were found to scale linearly. The proposed workflow provides a scalable, adaptable solution for 2D material characterization.

Source: APL Materials

DOI: 10.1063/5.0253848

Authors: Agnese Spustaka, Andrejs Terehovs, Aris Jansons, Gunta Kunakova

Institution: University of Latvia

Language: English

Topic: 2D Materials and Applications

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: gold

Estimated APC paid: $2,200

Funder: Latvijas Zinātnes Padome