An Improved FDR Defect Localization Method Based on K-Means Clustering and Fractional Fourier Transform
Year: 2024
Type: conference-paper
Authors: Bai Huang, Jian Fang, Fan Yang, Xiang Lin, Fengxiang Zhou, Zhikai Pang, Biao Pang
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: China Southern Power Grid
Award: G8869334995
OpenAlex ID: W4409326090