Some considerations on thick sample thickness in X-ray fluorescence analysis
Year: 2025
Type: article
DOI: 10.1039/d4ja00406j
Authors: Paweł Wróbel, Filip J. Baran
Institution: AGH University of Krakow
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409336183