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APPLICATION OF ATOMIC FORCE MICROSCOPY IN PREPARED Ni-Al LAYER BY A TWO-STAGE PROCESS

Year: 2025
Type: article
Abstract: A Ni-Al layer can provide substrate properties and has received widespread attention. This study investigates the morphology and composition of a Ni-Al layer fabricated on a steel substrate using a two-step method. Initially, an internal nickel layer was deposited via electroplating, followed by an aluminization process. The morphological and compositional characteristics of the resulting Ni-Al layer were analyzed using metallographic microscopy, scanning electron microscopy (SEM) coupled with energy-dispersive spectroscopy (EDS), and atomic force microscopy (AFM). The results revealed that the morphological changes to the Ni-Al layer are influenced by the aluminum content in the infiltration agent, and the data from AFM confirm this.
Authors: Ningning Li, Zhenjie Hao, Lei Xu, Xi Chen, Jin Peng, Leyu Wei, Mingqi Tang, Yuping Tong, Zicheng Ling, Yimin Li
Language: English
Open Access status: gold
Estimated APC paid: $323
OpenAlex ID: W4409371653
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Related to: 10