Work

An Integrated Multioutput Classification-Based Defect Diagnosis Model for Pick-and-Place Machines

Year: 2025

Type: article

Source: IEEE Transactions on Components Packaging and Manufacturing Technology

DOI: 10.1109/tcpmt.2025.3548548

Authors: Yuqiao Cen, Jingxi He, Daehan Won

Institutions: Stockton University, Binghamton University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409395274

FWCI: 0.507

Cites: 15

Cited by: 1

Related to: 10