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Anomaly Detection Control Through One-class Learning in Defect Inspection Systems

Year: 2025

Type: article

Source: Journal of Institute of Control Robotics and Systems

DOI: 10.5302/j.icros.2025.24.0280

Authors: Janggun Jeon, Namgi Kim

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409401516

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