Work

Difference Between SET and SEU Thresholds Measured by SPA Laser Testing in a 16-nm FinFET Programmable SoC

Year: 2025

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2025.3559206

Authors: M. Fongral, V. Pouget, F. Saigne, M. Ruffenach, F. Malou, J. Mekki

Institutions: Centre National de la Recherche Scientifique, Université de Montpellier, Institut d'Électronique et des Systèmes, Centre National d'Études Spatiales

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Centre National d’Etudes Spatiales

OpenAlex ID: W4409426879

FWCI:

Cites: 27

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Related to: 10