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Enhancing Toxic Comment Detection with BiLSTM-Based Deep Learning Model

Year: 2024

Type: conference-paper

Source: International Conference on Information Science and Communications Technologies (ICISCT)

DOI: 10.1109/icisct64202.2024.10956568

Authors: Naitik, Dharm Raj, D. Karthick Rajan, Ajay Kumar Gupta, Amrit Kumar Agrawal, Kunchanapaalli Rama Krishna

Institutions: Sharda University, Indian Institute of Technology Madras, IIMT College of Engineering, Greater Noida, Koneru Lakshmaiah Education Foundation

Language: English

Topic: Hate Speech and Cyberbullying Detection

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409426969

FWCI: 0.589

Cites: 10

Cited by: 2

Related to: 10