Work

Spectrogram-Based Fault Detection in Covered Conductors Using ResNet50V2 with SHAP and Grad-CAM Analysis

Year: 2025

Type: conference-paper

Source: International Symposium INFOTEH-JAHORINA (INFOTEH)

DOI: 10.1109/infoteh64129.2025.10959257

Authors: Lukas Klein, Ondrej Kabot, Tomas Mimra, Zdenek Slanina

Institution: VSB - Technical University of Ostrava

Language: English

Topic: High voltage insulation and dielectric phenomena

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409427247

FWCI: 15.67

Cites: 21

Cited by: 3

Related to: 10