Work

SWANet: A Sliding Window Affinity Network With Dual-Branch Structure for Detection of Automotive Chip Packaging Carriers

Year: 2025

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/tim.2025.3558829

Authors: Huimin Wang, Bumin Meng, Jiang Zhu, Rui Du

Institutions: Xiangtan University, Hunan University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G2353640471

OpenAlex ID: W4409427485

FWCI:

Cites: 58

Cited by:

Related to: 10