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Printed Circuit Board Defect Detection Based on Feature Pyramid Spatial Prior Network

Year: 2024

Type: conference-paper

Source: International Conference on Image Processing, Computer Vision and Machine Learning (ICICML)

DOI: 10.1109/icicml63543.2024.10958113

Authors: Zhongliang Lv, Xuanlin Chen, Zhenyu Lu, Kang Liu, Kewen Xia, Hailun Zuo, Beichen Ding

Institutions: Chongqing University of Science and Technology, Shanghai University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409427575

FWCI:

Cites: 9

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Related to: 10