Work

System-on-chip technology application on microwave imaging reflectometer

Year: 2025

Type: article

Source: Plasma Physics and Controlled Fusion

DOI: 10.1088/1361-6587/adcd2d

Authors: Xiaoliang Li, Yilun Zhu, Jo-Han Yu, Yu-Ting Chang, Ying Chen, Calvin Domier, Shasha Qiu, Xinhang Xu, Xianzi Liu, Jon Dannenberg, Neville Luhmann Jr

Institutions: Chinese Academy of Sciences, Institute of Plasma Physics, University of California, Davis

Language: English

Topic: Radio Frequency Integrated Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: U.S. Department of Energy

Award: INNOVATIVE DIAGNOSTIC DEVELOPMENTS FOR TURBULENCE AND TRANSPORT MEASUREMENT AND VISUALIZATION

OpenAlex ID: W4409468946

FWCI: 1.582

Cites: 47

Cited by: 7

Related to: 10