Work

Effect of Process Gradients and Process Parameter Correlation on Mismatch Modeling for Analog IC Design

Year: 2025

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2025.3558156

Author: Colin C. McAndrew

Language: English

Topic: Analog and Mixed-Signal Circuit Design

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409474746

FWCI: 1.446

Cites: 5

Cited by: 6

Related to: 10