Work

Investigation of TID and DD Effects on FD SOI Nanowire FET Induced by Proton Irradiation

Year: 2025

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2025.3558489

Authors: Dabok Lee, Jonghyeon Ha, Minki Suh, Minsang Ryu, Mikaël Cassé, Sergio Nicoletti, Dae-Young Jeon, Jungsik Kim

Institutions: Gyeongsang National University, Commissariat à l'Énergie Atomique et aux Énergies Alternatives, CEA Grenoble, Laboratoire d'Électronique des Technologies de l'Information

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: IC Design Education Center

OpenAlex ID: W4409474791

FWCI: 0.23

Cites: 30

Cited by: 1

Related to: 10