Work

A Low Cost Triple-Node-Upset Self-Recoverable Latch Design for Nanoscale CMOS

Year: 2025

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2025.3561519

Authors: Na Bai, Pengshuai Zhang, Yaohua Xu, Yunhui Guo, Hang Li, Yi Wang, Xiaoqing Wen

Institutions: Anhui University, National University of Defense Technology, Kyushu Institute of Technology

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: Anhui Provincial Quality Engineering Project, Natural Science Foundation of Anhui Province, University Natural Science Research Project of Anhui Province

Awards: G146147568, G2642604436, G7237027410

OpenAlex ID: W4409494247

FWCI: 0.227

Cites: 33

Cited by: 1

Related to: 10