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What Is the Best Way to Adjust for Surface Profile When Measuring Dry Film Thickness (DFT)?

Year: 2025

Type: conference-paper

DOI: 10.5006/c2025-00514

Author: Eric Squires

Language: English

Topic: Non-Destructive Testing Techniques

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409497953

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Related to: 10