Work

Towards More Accurate Industrial Anomaly Detection: A Component-Level Feature-Enhancement Approach

Year: 2025

Type: article

Abstract: Industrial visual inspection plays a crucial role in intelligent manufacturing. However, existing anomaly-detection methods based on unsupervised learning paradigms often struggle with issues such as overlooking minor defects and blurring component edges in confidence maps. To address these challenges, this paper proposes an industrial anomaly-detection method based on component-level feature enhancement. This method introduces a component-level feature-enhancement module, which optimizes feature matching by calculating the structural similarity between global coarse-grained confidence features and local fine-grained confidence features, thereby generating enhanced feature maps to improve the model’s detection accuracy for minor defects and local anomalies. Additionally, we propose a region-segmentation method based on multi-layer piecewise thresholds, which effectively distinguishes between foreground and background in confidence maps, circumvents background interference and ensures the integrity of structural information of foreground components. Experimental results demonstrate that the proposed method surpasses comparative methods in both logical and structural defect detection tasks, showing significant advantages, especially in fine-grained anomaly detection, with stronger robustness and accuracy.

Source: Electronics

DOI: 10.3390/electronics14081613