Year: 2025
Type: conference-paper
Abstract: In this paper, the total duration of different environmental stresses such as temperature, relative humidity, temperature change, and vibration under rated conditions are calculated according to the rated environmental load spectrum as the reference input condition for designing the accelerated test. The controller single-board reliability accelerated stress model is constructed by using the basic layer information of controller single-board components and the physical failure acceleration model of each sensitive environmental stress. The test conditions, such as equivalent total duration at high temperature and relative humidity, number of temperature cycles, test time per cycle, and acceleration factor, are determined. The board-level accelerated reliability test is designed with a mission profile and carried out to provide a technical solution for rapid evaluation of board-level reliability.
Authors: Xiaohui Liu, Man Li
Institution: Zhengzhou Institute of Machinery
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W4409505601