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Improving CNN Runtime Robustness Against Soft Errors by Dropout Layer Optimization

Year: 2025

Type: conference-paper

Source: IEEE Latin American Test Symposium (LATS)

DOI: 10.1109/lats65346.2025.10963963

Authors: Robert Limas Sierra, Giuseppe Esposito, Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Matteo Sonza Reorda

Institution: Politecnico di Torino

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409536746

FWCI: 2.293

Cites: 19

Cited by: 1

Related to: 10