Work

X-Ray Effects on Alpha-Induced Soft Error Rate in 3-D NAND Replacement Gate Flash Memory Cells

Year: 2025

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2025.3561936

Authors: Marta Bagatin, Silvia Beltrami, Alessandro Paccagnella, Simone Gerardin

Institutions: University of Padua, Micron (Italy)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409537043

FWCI:

Cites: 21

Cited by:

Related to: 10