Work

A novel approach for detecting negative charge accumulation induced by electron beam irradiation using power MOSFET devices

Year: 2025

Type: article

Source: Review of Scientific Instruments

DOI: 10.1063/5.0255403

Authors: Xianghe Fu, Yahui Cai, Wenjie Feng, Dan Wang, Yongning He

Institutions: Xi'an Jiaotong University, National University of Defense Technology

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G7428662138

OpenAlex ID: W4409543631

FWCI:

Cites: 21

Cited by:

Related to: 10