Work

Energy-Efficient Brain-Inspired Self-Attention-Spiking Neural Network Framework for Mix-Type Wafer Defect Recognition

Year: 2025

Type: article

Source: IEEE Sensors Journal

DOI: 10.1109/jsen.2025.3560087

Authors: Dandan Peng, Yitian Wang, Xinhe Zhou, Jiale Liu, Chenyu Liu, Te Han

Institutions: Hong Kong Polytechnic University, University of California San Diego, University of Electronic Science and Technology of China, Northwestern Polytechnical University, Beijing Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G8335023151

OpenAlex ID: W4409560446

FWCI: 1.508

Cites: 40

Cited by: 3

Related to: 10