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Approximate Analytical Model Evaluating Digital Systems Compliance with Automotive Standards

Year: 2025

Type: conference-paper

Source: IEEE Latin American Test Symposium (LATS)

DOI: 10.1109/lats65346.2025.10963951

Authors: Esther Goudet, Fabio Sureau, Manan Kaila, Rémi Germe, Luis Peña Treviño, Jean-Marc Daveau, Lirida Naviner, Philippe Roche

Institutions: Institut Polytechnique de Paris, Laboratoire Traitement et Communication de l’Information, STMicroelectronics (France)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409561489

FWCI:

Cites: 28

Cited by:

Related to: 10