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Er 3+ ‐doped amorphous tellurite thin films

Year: 2025
Type: article
Abstract: Radio‐frequency (RF) magnetron sputtering was used to deposit amorphous tellurite thin films from glassy targets from TeO 2 –ZnO–Na 2 O/BaO/Bi 2 O 3 system doped with 2.5 mol% of Er 2 O 3 . The impact of the sputtering power on the optical, luminescence, and structural properties of the films is discussed. The deposition process leads to amorphous and transparent films which emit light in the visible and near‐infrared confirming the presence of Er 3+ in the films’ network. Owing to their large refractive index and stability overtime, the Bi containing films are potential materials for integrated photonics and optical switches.
DOI: 10.1111/jace.20589
Authors: Pradeep Ramanan, Jan Gutwirth, Stanislav Slang, Anupama Viswanathan, Taghrid Ghanawi, Florent Starecki, Virginie Nazabal, Matthieu Roussey, Petr Němec, Laeticia Petit
Institutions: University of Pardubice, Tampere University, University of Tampere, Institut des Sciences Chimiques de Rennes, Université de Rennes, École Nationale Supérieure d'Ingénieurs de Caen, Centre de Recherche sur les Ions, les Matériaux et la Photonique, University of Eastern Finland
Language: English
Open Access status: hybrid
Estimated APC paid: $4,070
OpenAlex ID: W4409579243
FWCI: 0.957
Cites: 55
Cited by: 3
Related to: 10