Study on accelerated life model of weak components of electronic fuze under multiple stresses
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3065295
Authors: Wenxin Luo, Mingkai Yue, Cong Zhang
Institution: Shenyang University of Technology
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409580619