Work

MetaRGBX-Net: RGB Sensitivity and Cross-Talk Prediction in CMOS Image Sensor

Year: 2025

Type: article

Source: IEEE Electron Device Letters

DOI: 10.1109/led.2025.3562529

Authors: JangHyeon Lee, ByoungGyu Kim, Yongkeun Lee

Institutions: University of Minnesota, Seoul National University of Science and Technology

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Seoul National University of Science and Technology

OpenAlex ID: W4409581193

FWCI: 0.226

Cites: 25

Cited by: 1

Related to: 10