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Enhancing Fault Tolerance in Self-Healing Hardware Using Triple Modular Redundancy

Year: 2025

Type: article

Source: International Scientific Journal of Engineering and Management

DOI: 10.55041/isjem02849

Author: Ranu Singh

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409593060

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