Work

A New Method of Industrial Passivation for Characterization of Surface Defects in Silicon‐Based Materials or Solar Cell Precursors

Year: 2025

Type: article

Source: physica status solidi (RRL) - Rapid Research Letters

DOI: 10.1002/pssr.202400411

Authors: Xiao Wang, Rui Yang, Wenheng Li, Jingwei Chen, Jingwei Chen, Ziqi Zhao, Yuhua Bai, Bingbing Chen, Xuning Zhang, Jianhui Chen, Jianhui Chen

Institution: Hebei University

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Natural Science Foundation of Hebei Province

Awards: G4310467990, G4758285093, G5736821405, G5763011566, G62892016

OpenAlex ID: W4409604718

FWCI: 0.226

Cites: 27

Cited by: 1

Related to: 10