Application of Neural Networks to Testing Printed Circuit Boards Using Data from a X-ray 3D Microtomograph
Year: 2025
Type: article
Authors: V. I. Syryamkin, F. A. Klassen, A. N. Bertsun
Institution: National Research Tomsk State University
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409622797