Yttrium Doped Hf₀.₅Zr₀.₅O₂ Based Ferroelectric Capacitor Exhibiting Fatigue Free (>10₁₂ Cycles), Long Retention, and Imprint Immune Performance at 4 K
Year: 2025
Type: article
Source: IEEE Electron Device Letters
Authors: A. Agarwal, A. M. Walke, N. Ronchi, M. I. Popovici, W. C. Y. Ma, C. J. Su, K. H. Kao, Jan Van Houdt
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G16935026, G6176843618, G7619047382
OpenAlex ID: W4409640810
