Work

Pre-Processing Measurement Data for Computing Internal DC Resistance with Anomaly Detection Techniques

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Power Electronics, Drives and Energy Systems

DOI: 10.1109/pedes61459.2024.10961023

Authors: Shaurya Pandey, Sarbani Mandal, Bikash Sah, Sai Krishna Mulpuri, Praveen Kumar

Institutions: Indian Institute of Technology Guwahati, Hochschule Bonn-Rhein-Sieg, Oak Ridge National Laboratory

Language: English

Topic: Advanced Battery Technologies Research

Subfield: Automotive Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409641997

FWCI:

Cites: 11

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Related to: 10