Synergistic effects of strain and chemical environment on defect engineering in γ-CsPbI3
Year: 2025
Type: article
Source: Applied Physics Letters
DOI: 10.1063/5.0253443
Authors: Tao Luo, Zhijuan Chen, Chunzhi Liu, Jianen Zhang, Tao Yin, Min Zhang, Xiaobo Chen, Xu Li, Li Guan
Institutions: Hebei University, University of Missouri–Kansas City
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G3288144089, G3557521721
OpenAlex ID: W4409644638