Automated identification of repeated chip layout patterns
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3050847
Authors: Runzhi Wang, Shu Kong, Lin Wang, Yongdong Wang, Jiang Hu
Institutions: Texas A&M University, Synopsys (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409655104