Work

Machine learning-assisted pattern optimizations for fixing design for manufacturability (DFM) rule check violations

Year: 2025

Type: conference-paper

DOI: 10.1117/12.3051488

Authors: Lynn T. N. Wang, Fadi Batarseh, Ivan Tanev, Klaus-Peter Johnsen, Teodora Nicolae, David Villarreal, Asen Petkov, Anastasia Yakimovska

Institutions: GlobalFoundries (United States), GlobalFoundries (Germany)

Language: English

Topic: VLSI and FPGA Design Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409655152

FWCI:

Cites: 5

Cited by:

Related to: 10