Measuring Out-of-Plane Permittivity of Thin Films to Millimeter Wave Frequencies
Year: 2025
Type: article
Authors: Florian Bergmann, Meagan C. Papac, Ben F. Jamroz, Bryan T. Bosworth, Nicholas R. Jungwirth, Anna Osella, Lucas Enright, Kristen L. Steffens, Rob Jones, Tomasz Karpisz, Eric J. Marksz, Angela Stelson, Christian J. Long, Nathan D. Orloff
Institution: National Institute of Standards and Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409659483