Localized Forgery Detection: Integrating DeepLabV3 With Error Level Analysis
Year: 2025
Type: conference-paper
Authors: Akshara A, Gayathri R, Alex Raj S M
Institution: College of Engineering Trivandrum
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409659981